Abstract

Recently Electronic Speckle Pattern Interferometry(ESPI) has been studied because it has the advantages to be able to measure the whole-field surface deformations of engineering components and materials in industrial areas with noncontact. The speckle patterns to be formed with interference phenomena of scattering light from rough surfaces illuminated by laser light have phase informations of surface deformations. In this study we used this interference phenomena and the phase shifting method to measure the inplane deformations, together with the use of digital image equipment to process the informations contained in the speckle pattern and to display consequent interferograms on TV monitor. FEA was performed before experiments and we obtained good agreement between the experimental results and FEA.

Keywords

• Electronic Speckle Pattern Interferometry;
• In-plane Displacement;
• Interferogram;
• Image Processing;
• Phase Shifting Method;
• FEA

• 전자 스페클 패턴 간섭법;
• 면내 변위;
• 간섭무늬;
• 화상처리;
• 위상이동법;
• 유한요소해석;