Quantification of Surface Topography Using Digital Image Analysis

  • Published : 1999.06.01

Abstract

It was found that surface roughness has a first-order effect on the interface shear strength and accordingly it should be accurately quantified if its role is to be properly understood. To quantify the surface topography, first of all, a variety of commonly used surface roughness parameters and profiling methods were reviewed in this study. Based on this review, the normalized roughness parameter. $R_n$(Uesugi and Kishida, 1986), the profile roughness parameter, $R_L$, and the surface roughness parameter, $R_n$(Dove and Frost, 1996), were selected to be appropriate candidates of roughness parameters and the digital image analysis based Optical Profile Microscopy(OPM) method(Dove and Frost, 1996) to be an appropriate profiling method for this study. Using a smooth and three textured HDPE geomembranes which encompass the range of textures and texture patterns commonly used, a series of roughness measurements on virgin and previously used geomembranes were performed. The results showed that both $R_L\; and\; R_S$ values appropriately reflect the degree of texturing for the geomembranes used in this study, however, $R_n$ value showed limited ranges of variation which may not be sufficient to permit distinction between roughness values for certain conditions. The results of this study will be extended to the investigation of the influence of surface roughness on interface strength in future study.

여러 연구들을 통하여 표면 거칠음 정도가 접촉면 전단력에 매우 중요함이 밝혀졌으며, 따라서 그 역할을 충분히 이해하기 위해서는 표면 거칠음 정도가 정확히 정량화 되어야 한다. 이 연구에서는 표면 형상을 정량화하기 위하여 일반적으로 사용되는 표면 거칠기 매개변수와 측정방법에 대하여 여러 참고문헌들을 검토하였다. 이것을 바탕으로 Normalized Roughness Parameter, $R_n$ (Uesugi and Kishida, 1986), Profile Roughness Parameter, $R_L$, 그리고 Surface Roughness Parameter, $R_n$(Dove and Frost, 1996)가 적합한 표면 거칠기 매개변수로 선택되었으며, 디지털 이미지 분석 시스템을 이용한 Optical Profile Microscopy(OPM) 방법을 표면 거칠음 측정방법으로 선택하였다 이 실험장비를 이용하여 일반적으로 사용되는 지오멤브레인의 표면과 표면 패턴을 대표하는, 표면이 매끄러운 것과 3가지 종류의 돌기형 HDPE 지오멤브레인을 사용하여, 전단 시험에 사용되지 않았던 지오멤브레인과 전단시험후의 지오멤브레인에 대한 표면 거칠음 정도의 정량화 작업을 수행하였다. 그 결과, $R_L과\; R_S$값은 이 연구에 사용된 지오멤브레인의 거칠음 정도를 충분한 측정범위로 표현할 수 있는 매개변수로 밝혀졌으나, $R_n$값은 충분히 표면 거칠음 정도의 차이를 표현하기에는 부족하게 매우 좁은 변화 범위를 나타내었다. 이 연구는 접촉면에서 표면 거칠음 정도가 접촉면 전단력에 미치는 영향을 조사하고자 우선적으로 표면 거칠음 정도의 정량화 작업을 연구한 것이다.

Keywords

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