Self Field Effect Analysis of Bi-2223 Tape-Stacked-Cable With Constant Current Density Assumption

Abstract

In this paper, we analyze self field effects of Bi-2223 tape-stacked cable assuming constant current density in the cross section of stacked cable. Generally, the critical current of Bi-2223 tape-stacked-cable in much less than the total summation of critical currents of each tape, which is mainly due to the self magnetic fields of the cable itself. Therefore, to predict the critical current of Bi-2223 tape-stacked-cable, we needs to analyze the self filed effects on the stacked cable as well as critical current density data(J$\_$C/) of one tape. To make it more complex, the critical current degradation of Bi-2223 tape is an-isotropic; the critical current is lower in the normal magnetic field(to the tape surface) than in the parallel field. In the paper, a novel approach to predict the critical current of a Bi-2223 tape-stacked-cable from a J$\_$C/-B curve of one tape is presented with the assumption of constant current density across the stacked cable, The approach basically includes the load analysis of the stacked tapes, and its usefulness is confirmed by the experimental data.

Keywords

• self-field effet;
• HTS tape;
• J$_{}$ c/degradation