Transactions on Electrical and Electronic Materials
- Volume 2 Issue 1
- /
- Pages.32-38
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- 2001
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- 1229-7607(pISSN)
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- 2092-7592(eISSN)
Simulation of a Novel Lateral Trench Electrode IGBT with Improved Latch-up and Forward Blocking Characteristics
- Kang, Ey-Goo (Department of Electrical Engineering, korea University) ;
- Moon, Seung-Hyun (Department of Electrical Engineering, korea University) ;
-
Kim, Sangsig
(Department of Electrical Engineering, korea University)
;
- Sung, Man-Young (Department of Electrical Engineering, korea University)
- Published : 2001.03.01
Abstract
A new small sized Lateral Trench electrode Insulated Gate Bipolar Transistor(LTEIGBT) was proposed to improve the characteristics of conventional Lateral IGBT (LIGBT) and Lateral Trench gate IGBT (LTIGBT). The entire electrode of LTEIGBT was replace with trench-type electrode. The LTEIGBT was designed so that the width of device was no more than 19 ㎛. The Latch-up current densities of LIGBT, LTIGBT and the proposed LTEIGBT were 120A/㎠, 540A/㎠, and 1230A/㎠, respectively. The enhanced latch-up capability of the LTEIGBT was obtained through holes in the current directly reaching the cathode via the p+ cathode layer underneath n+ cathode layer. The forward blocking voltage of the LTEIGBT is 130V. Conventional LIGBT and LTIGBT of the same size were no more than 60V and 100V, respectively. Because the the proposed device was constructed of trench-type electrodes, the electric field moved toward trench-oxide layer, and punch through breakdown of LTEIGBT is occurred, lately.
Keywords
- Trench Electrode;
- Power Integrated Circuit;
- Latch-up;
- Forward Blocking Voltage;
- Turn-off;
- SOI Thickness;
- Power Transistor