The Transactions of the Korean Institute of Electrical Engineers D (대한전기학회논문지:시스템및제어부문D)

The Korean Institute of Electrical Engineers (대한전기학회)
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An Efficient diagnosis Algorithm for High Density Memory

고집적 메모리를 위한 효율적인 고장 진단 알고리즘

  • 박한원 (연세대 공대 전기전자공학과) ;
  • 강성호 (연세대 공대 전기전자공학과)
  • Published : 2001.04.01
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Abstract

As the high density memory is widely used in the various applications, the need for reproduction of memory is increased. In this paper we propose an efficient fault diagnosis algorithm of linear order O(n) that enables the reproduction of memory. The new algorithm can distinguish various fault models and identify all the cells related to the faults. In addition, a new BIST architecture for fault diagnosis is developed. Using the new algorithm, fault diagnosis can be performed efficiently. And the performance evaluation with previous approaches proves the efficiency of the new algorithm.

Keywords

References

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