Silicon Absorption Characteristics of Tomato Grown under Perlite Culture

펄라이트 수경재배 토마토의 규소 흡수 특성

Kim, Young-Chul;Kim, Kwang-Yong;Park, kuen-Woo;Yun, Hyung-Kweon;Seo, Tae-Cheol;Lee, Ji-Weon;Lee, Sang-Gyu
김영철;김광용;박권우;윤형권;서태철;이지원;이상규

  • Published : 20020000

Abstract

Si$O_{2}$ (silicon dioxide) content of leaves was high in silicate treatment than the control and in lower leaves than upper ones. Soluble silicon content of fruit was higher in silicate treatment than control and was 6~9 times higher in lower fruits than upper ones. Soluble silicon content of fruit was highest at 34 to 41 days after fruit setting, and was least at 48 days after fruit setting. Plant surface observed microscopically with EDX-ray showed that the amount of silicon was high in stem and root than leaf surface. Si$O_{2}$ content of the pericarp and flesh had no difference between treatments.

식물체 잎에서의 규소 함량은 규소 혼용구에서 무혼용구에 비해 높았으며, 상위엽 보다 하위엽에 규소 함량이 높았다. 과실의 규소 함량은 각 혼용구 모두 1화방에서 높았고, 상단 화방으로 올라갈수록 낮았다. 과실 성숙 단계별 규소 함량은 동화산물이 sink인 과실로의 이동이 활발하여 과실 비대가 왕성히 이루어지는 착과 후 34일부터 41일 사이에 규소 함량이 최고치를 나타내었으며, 과실 비대 후기로 갈수록 낮아졌다. 규소의 식물체 내 분포도에 대한 EDX-ray 검경 결과 잎에서는 극미량의 규소가 검경되었으며, 줄기와 뿌리에서는 상당 부분 분포되어 있음을 알 수 있었다.

Keywords

References

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