DOI QR코드

DOI QR Code

Single Crystal Silicon Thin Film Transistor using 501 Wafer for the Switching Device of Top Emission Type AMOLEDs

SOI 웨이퍼를 이용한 Top emission 방식 AMOLEDs의 스위칭 소자용 단결정 실리콘 트랜지스터

  • Published : 2003.04.01

Abstract

We fabricated a single crystal silicon thin film transistor for active matrix organic light emitting displays(AMOLEDs) using silicon on insulator wafer (SOI wafer). Poly crystal silicon thin film transistor(poly-Si TFT) Is actively researched and developed nowsdays for a pixel switching devices of AMOLEDs. However, poly-Si TFT has some disadvantages such as high off-state leakage currents and low field-effect mobility due to a trap of grain boundary in active channel. While single crystal silicon TFT has many advantages such as high field effect mobility, low off-state leakage currents, low power consumption because of the low threshold voltage and simultaneous integration of driving ICs on a substrate. In our experiment, we compared the property of poly-Si TFT with that of SOI TFT. Poly-Si TFT exhibited a field effect mobility of 34 $\textrm{cm}^2$/Vs, an off-state leakage current of about l${\times}$10$\^$-9/ A at the gate voltage of 10 V, a subthreshold slope of 0.5 V/dec and on/off ratio of 10$\^$-4/, a threshold voltage of 7.8 V. Otherwise, single crystal silicon TFT on SOI wafer exhibited a field effect mobility of 750 $\textrm{cm}^2$/Vs, an off-state leakage current of about 1${\times}$10$\^$-10/ A at the gate voltage of 10 V, a subthreshold slope of 0.59 V/dec and on/off ratio of 10$\^$7/, a threshold voltage of 6.75 V. So, we observed that the properties of single crystal silicon TFT using SOI wafer are better than those of Poly Si TFT. For the pixel driver in AMOLEDs, the best suitable pixel driver is single crystal silicon TFT using SOI wafer.

Keywords

References

  1. IEEE Trans. Electron Devices v.42 High performance poly-Si TFT fabricated using pulsed laser annealing and remote plasma CVD with low temperature processing A. Kohno;T. Sameshima;N. Sano;M. Sekiya;M. Hara https://doi.org/10.1109/16.370072
  2. J. Appl. Phys. v.31 Conduction mechanism of leakage current observed in metal-oxide-semiconductor transistorand poly-Si thin-film transistor M.Yazaki;S. Takenaka;H. Oshima https://doi.org/10.1143/JJAP.31.206
  3. IEEE Electron Device Letter v.20 Low-leakage germanium seeded laterally-crystallized single-grain 100-nm TFT's for vertical integration applications Vivek Subramanian;Member;IEEE;Masato Toita;Nabeel R https://doi.org/10.1109/55.772370
  4. Appl. Phys. Lett. v.70 Modeling of stress-induced leakage current in ultrathin oxides with the trap-assisted tunneling mechanism Anthony I. Chou;Kafai Lai;Kiran Kumar;Prasenjit Chowdhury;Jack C. Lee https://doi.org/10.1063/1.119186
  5. Appl. Phys. Lett. v.72 Leakage current models of thin film silicon-on-insulator devices Hank Shin;Stella Hong;Tom Wetteroth;Syd R. Wilson https://doi.org/10.1063/1.121012
  6. Journal of Non-Crystalline Solids v.266 Performance improvement of polycrystalline thin-film transistor by adopting a very thin amorphous silicon buffer Kyung Wook Kim;Kyu Sik Cho;Jin Jang https://doi.org/10.1016/S0022-3093(99)00935-7
  7. Circuit Design for CMOS VLSI J. P. Uyemura
  8. ASIA DISPLAY'95 S.Inoue(et al.)
  9. 전기전자재료학회논문지 v.17 no.7 SOINMOSFET을 이용한 Photo Detector의 특성 김종준;정두연;이종호;오환술 https://doi.org/10.4313/JKEM.2002.15.7.583
  10. 전기전자재료학회논문지 v.11 no.6 저전압동작에 적절한 SOI-like-bulk CMOS 구조에 관한 연구 손상희;진 태
  11. 전기전자재료학회논문지 v.14 no.4 인가바이어스 조건이 전기화학적 식각정지 특성에 미치는 영향 정귀상;강경두;김태송;이원재;송재성