The Study of Near-field Scanning Microwave Microscope for the Nondestructive Detection System

비파괴 측정을 위한 근접장 마이크로파 현미경 연구

  • Published : 2004.10.30

Abstract

We described a near-field scanning microwave microscope which uses a high-quality dielectric resonator with a tunable screw. The operating frequency is f=4.5 5GHz. The probe tip is mounted in a cylindrical resonant cavity coupled to a dielectric resonator We developed a hybrid tip combining a reduced length of the tapered part with a small apex. In order to understand the function of the probe, we fabricated three different tips using a conventional chemical etching technique and observed three different NSMM images for patterened Cr films on glass substrates. We measured the reflection coefficient of different metal thin film samples with the same thickness of 300m and compared with theoretical impedance respectly. By tuning the tunable screw coming through the top cover, we could improve sensitivity, signal-to-noise ratio, and spatial resolution to better than $1{\mu}m$. To demonstrate the ability of local microwave characterization, the surface resistance of metallic thin films has been mapped.

근접장의 특성과 근접장 마이크로파 현미경의 배경이론을 설명하였고 유전체 공진기 제작에 앞서 HFSS (high frequency structure simulator)를 이용한 모의 시뮬레이션을 기술하였다. 이것을 바탕으로 원통형 유전체 공진기를 제작하여 금속탐침과 결합한 근접장 마이크로파 현미경(near field scanning microwave microscope : NSMM)을 구성하였다. 제작한 유전체 공진기의 특성은 HFSS를 이용하여 모의 실험한 결과와 비교하였다 Tip의 기하학적 모양에 따른 공간분해능과 감도(sensitivity)를 연구하였고 contrast가 가장 좋은 hybrid tip을 개발하였다. 전도도가 서로 다른 금속시료에 따른 NSMM의 반사계수의 변화를 측정하였고 실험결과와 이론적 시료의 임피던스를 비교하였다. 마지막으로 유전체 공진기를 이용한 NSMM으로 공간 분해능이 $1{\mu}m$의 Cr과 NiFe 패턴의 이미지를 비접촉, 비파괴방법으로 얻었다.

Keywords

References

  1. E. Hecht, 'Optics,' Addison-Wesley, (1987)
  2. Ch. Sikorsi and U. Merkt, 'Spectroscopy of electronic states in InSb quantum dots,' Phys Rev. Lett., Vol. 62, p. 2164 (1989) https://doi.org/10.1103/PhysRevLett.62.2164
  3. D. K. Biegelsen, R. D. Bringans, J. E. Northrup and L. E. Swartz, 'Reconstructions of GaAs surfaces observed by scanning tunneling microscopy,' Phys. Rev. Lett., Vol. 65, p. 452 (1990) https://doi.org/10.1103/PhysRevLett.65.452
  4. E. A. Ash and G. Nicholls, 'Super-resolution aperture scanning microscope,' Nature, Vol. 237, p. 510 (1972) https://doi.org/10.1038/237510a0
  5. C. Gao and X. - D Xiang, 'Quantitative microwave near-field microscopy of dielectric properties,' Rev. Sci. Instrum., Vol. 69, p. 3946 (1998)
  6. D. E. Steinhauer, C P. VIahacos, S. K. Dutta, B. J. Feenstra, F. C. Wellstood and S. M. Analge, 'Quantitative imaging of sheet resistance with a Scanning near-field microwave microscope', ' Appl. Phys. Lett., Vol. 72, p. 861 (1998)
  7. Tabib-Azar, D -P Su, A .Pohar, S. R. Leclar and G.. Ponchak, '0.4 $\mu$<,TEX>m spatial resolution with 1 GHz $\lambda$<,TEX> = 30 em) evanescent, microwave probe,' Rev. Sci. Instrum. VoL 70, 1725 (1999)
  8. 김주영, 홍성혁, 박원균, 이기진, '동조 가능한 동축선 공진기를 사용한 마이크로파 근접장 현미경 제작' 새무리 VoL 42. No.6, p. 281(2001)
  9. M. Golosovsky and D. Davidov, 'Novel millimeter-wave near-field resistivity microscope,' Appl. Phys. Lett., Vol. 68, p. 1579 (1996) https://doi.org/10.1063/1.116685
  10. A. F. Lann, M. Golosovsky, D. Davidov and A. Frenkel, 'Combined millimeter-wave near-field microscope and capacitance distance control for the quantitative mapping of sheet resistance of conducting layers,' Appl. Phys. Lett., Vol. 73, p. 2832 (1998) https://doi.org/10.1063/1.122605
  11. J. Bae, T. Okamoto, T. Fujii, K. Mizuno and T. Nozokido, 'Experimental demonstration for scanning near-field optical microscopy using a metal micro-slit probe at millimeter wavelengths,' Appl. Phys. Lett., Vol. 71, p.3581 (1997) https://doi.org/10.1063/1.120397
  12. Park Wonkyun, Kim Jooyoung and Lee Kiejin, 'Millimeter-wave scanning near-field microscope using a resonant waveguide probe,' Appl. Phys. Lett., Vol. 79, p. 2642 (2001) https://doi.org/10.1063/1.1409944
  13. M. Ohtsu, 'Near-field nanolAtom Optics and technology,' Springer, (1998)
  14. H. M. Altshuler, 'Handbook of Microwave Measurements II, ' Polytechnic Institute of Brooklyn, Brooklyn, NY, (1963)
  15. Kim Jooyoung, Barry Friedman, Deokjoon Cha, and kiejin Lee 'Near-field scanning microwave microscope using a dielectric resonator ,' Appl. Phys. Lett., Vol. 83, p. 1032 (2003)
  16. Kim Jooyoung, Myungsick Kim, Hyun Kim, Doohee Song, Barry Friedman and Kiejin Lee 'Improving images from a near-field scanning mcrowave microscope using a hybrid probe,' Appl. Phys. Lett., Vol. 83, p. 1026 (2003)
  17. C. P. Vlahacos, R. C. Black, S. M. Anlage, A. Amar and F. C. Wellstood, 'Near-field scanning microwave microscope with 100 $\mu$<,TEX>m resolution,' Appl. Phys. Lett., Vol. 69, p. 3272 (1996) https://doi.org/10.1063/1.118033