Journal of the Optical Society of Korea

Optical Society of Korea (한국광학회)
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Reflection-type Optical Waveguide Index Profiling Technique

  • Youk YoungChun (Department of Information and Communications, Gwangju Institute of Science and Technology) ;
  • Kim Dug Young (Department of Information and Communications, Gwangju Institute of Science and Technology)
  • Received : 2005.03.15
  • Published : 2005.06.01
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Abstract

We report a new configuration of a reflection-type confocal scanning optical microscope system for measuring the refractive index profile of an optical waveguide. Several improvements on the earlier design are proposed; a light emitting diode (LED) at 650 nm wavelength instead of a laser diode (LD) or He-Ne laser is used as a light source for better index precision, and a simple longitudinal linear scanning and curve fitting techniques are adapted instead of a servo control for maintaining an optical confocal arrangement. We have obtained spatial resolution of 700 nm and an index precision of $2\times10^{-4}$. To verify the system's capability, the refractive index profiles of a conventional multimode fiber and a home-made four-mode fiber were examined with our proposed measurement method.

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References

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  1. Measurement of Refractive Index Profile of Optical Fiber Using the Diffraction Phase Microscope vol.23, pp.4, 2012, https://doi.org/10.3807/KJOP.2012.23.4.135
  2. Fourier-domain low-coherence interferometry for differential mode delay analysis of an optical fiber vol.31, pp.16, 2006, https://doi.org/10.1364/OL.31.002396