Transactions on Electrical and Electronic Materials

The Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회)
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Fault Current Limiting Characteristics of Flux-lock Type SFCL with Several Secondary Windings

  • Lim, Sung-Hun (Research Center of Industrial Technology, Engineering Research Institute, Chonbuk National University) ;
  • Park, Chung-Ryul (Division of Electronics and Information Engineering, Chonbuk National University) ;
  • Han, Byoung-Sung (Division of Electronics and Information Engineering, Chonbuk National University) ;
  • Park, Hyoung-Min (Department of Electrical Engineering, Chosun University) ;
  • Cho, Yong-Sun (Department of Electrical Engineering, Chosun University) ;
  • Choi, Hyo-Sang (Department of Electrical Engineering, Chosun University)
  • Published : 2005.10.01
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Abstract

We investigated fault current limiting characteristics of the flux-lock type superconducting fault current limiter (SFCL), which consisted of a primary winding and several secondary windings connected in series between $high-T_C$ superconducting (HTSC) thin films. Each YBCO thin film has a 2 mm wide and 42 cm long meander line with 14 stripes of different length. The power imbalance due to the slight difference of Ie between YBCO current limiting elements causes the significant power burden on YBCO element with lower $I_C$. We confirmed from our experiments that the mutual coupling between the primary winding and secondary windings of the flux-lock type SFCL reduced the power imbalance between YBCO current limiting elements compared with the resistive type SFCL connected in series.

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References

  1. M. Noe and B. R. Oswald, 'Technical and economical benefits of superconducting fault current limiters in power systems', IEEE Trans. Appl. Superconducd., Vol. 9, No. 2, p. 1347, 1996
  2. W. Paul, M. Chen, M. Lakner, J. Rhyner, D. Braun, and W. Lanz, 'Fault current limiter based on high temperature superconductors - different concepts, test results, simulations, applications', Physica C, Vol. 354, No. 1-4, p. 27, 2001 https://doi.org/10.1016/S0921-4534(01)00132-0
  3. T. Hoshino, K. M. Salim, M. Nishikawa, I. Muta, and T. Nakamura, 'Proposal of saturated DC reactor type superconducting fault current limiter (SFCL)', Cryogenics, Vol. 41, No.7, p. 469, 2001
  4. D. Ito, C. Yang, O. Miura, M. Morita, and T. Tokunaga, 'kA class resistive fault current limiting device development using QMG HTC bulk superconductor', IEEE Trans. on Appl. Supercond., Vol. 9, No.2, p. 1312, 1999
  5. Y. Kudo, H. Kubota, H. Yoshino, and Y. Wachi, 'Improvement of maximum working voltage of resistive fault current limiter using YBCO thin film and metal thin film', Physica C, Vol. 372-376, No. 3, p. 1164, 2002
  6. K. Shimohata, S. Yokoyama, T. Inaguchi, S. Nakamura, and Y. Ozawa, 'Design of a large current-type fault current limiter with YBCO film', Physica C, Vol. 372-376, No.3, p. 1643, 2002
  7. O.-B. Hyun, S.-D. Cha, H.-R. Kim, H.-S. Choi, and S.-D. Hwang, 'Shunt-assisted simultaneous quench of resistive SFCL components in series', IEEE Trans. Appl. Superconduct., Vol. 13, No.2, p. 2060, 2003
  8. K. B. Park, J. S. Kang, B. W. Lee, I. S. Oh, H. S. Choi, H. R. Kim, and O. B. Hyun, 'Quench behavior of YBaCuO films for fault current limiters under magnetic field', IEEE Trans. Appl. Superconducd., Vol. 13, No.2, p. 2092, 2003
  9. H.-S. Choi, O.-B. Hyun, H.-R. Kim, and K.-B. Park, 'Switching properties of a hybrid type superconducting fault current limiter using YBCO stripes', IEEE Trans. Appl. Superconducd., Vol. 14, No.3, p. 1833, 2002
  10. S.-H. Lim, H.-G. Kang, H.-S. Choi, S.-R. Lee, and B.-S. Han, 'Current limiting characteristics of flux-lock type high- Tc superconducting fault current limiter with control circuit for magnetic field', IEEE Trans. Appl. Superconducd., Vol. 13, No.2, p. 2056, 2003
  11. S. H. Lim, H. S. Choi, and B. S. Han, 'Fault current limiting characteristics' due to winding direction between coil 1 and coil 2 in a flux-lock type SFCL', Physica C, Vol. 416, No. 1-2, p. 34, 2004 https://doi.org/10.1016/j.physc.2004.08.008