References
- N. R. Rueger, M. F. Doemling, M. Schaepkens, J. J. Beulens, T. E. F. M. Standaert and G. S. Oehrlein, J. Vac. Sci. Technol. A 17, 2492 (1999) https://doi.org/10.1116/1.581987
- T. E. F. M. Standaert, M. Schaepkens, N. R. Rueger, P. G. M. Sebel, G. S. Oehrlein and J. M. Cook, J. Vac. Sci. Technol. A 16, 239 (1998) https://doi.org/10.1116/1.580978
- S. Hyashi, H. Nakagawa, M. Yamanaka and M. Kubota, Jpn. J. Appl. Phys. 36, 4845 (1997) https://doi.org/10.1143/JJAP.36.4845
- K. Miyata, M. Hori and T. Goto, J. Vac. Sci. Technol. A 14, 2343 (1996) https://doi.org/10.1116/1.580020
- C. Suzuki, K. Sasaki and K. Kadata, J. Appl. Phys. 82, 5321 (1997) https://doi.org/10.1063/1.366298
- K. Tachibana, H. Kamisagi and T. Kawasaki, Jpn. J. Appl. Phys. 28, 4367 (1999)
- T. Kimura and K. Ohe, J. Appl. Phys. 92, 1780 (2002) https://doi.org/10.1063/1.1491023
- L.-M. Buchmann, F. Heirich, P. Hoffmann and J. James, J. Appl. Phys. 67, 3635 (1990) https://doi.org/10.1063/1.345317
- S. Den, T. Kuno, M. Ito, M. Hori, T. Goto, Y. Hayashi and Y. Sakamoto, Jpn. J. Appl. Phys. 35, 6528 (1996) https://doi.org/10.1143/JJAP.35.6528
- D. Zhang and M. J. Kushner, J. Vac. Sci. Technol. A 18, 2661 (2000) https://doi.org/10.1116/1.1319816
- G. Cunge and J. P. Booth, J. Appl. Phys. 85, 3952 (1999) https://doi.org/10.1063/1.370296
- J. P. Booth, G. Cunge, P. Chabert and N. Sadeghi, J. Appl. Phys. 85, 3097 (1999) https://doi.org/10.1063/1.369649
- C. I. Butoi, N. M. Mackie, K. L. Willians, N. E. Capps and E. R. Fisher, J. Vac. Sci. Technol. A 18, 2685 (2000) https://doi.org/10.1116/1.1312371
- K. L. Steffens and M. A. Sobolewski, J. Vac. Sci. Technol. A 17, 517 (1999) https://doi.org/10.1116/1.581613
- S. Hayashi, K. Kawashima, N. Ozawa, H. Tsuboi, Y. Tatsumi and M. Sekine, Sci. Technol. Adv. Mat. 2, 555 (2001) https://doi.org/10.1016/S1468-6996(01)00137-1
- M. Haverlag, W. W. Stoffels, E. Stoffels, G. M. W. Kroesen and F. J. de Hoog, J. Vac. Sci. Technol. A 14, 384 (1994)
- D. C. Seo, T. H. Chung, H. J. Yoon and G. H. Kim, J. Appl. Phys. 89, 4218 (2001) https://doi.org/10.1063/1.1354633
- S. Panda, D. J. Economou and M. Meyyappan, J. Appl. Phys. 87, 8323 (2000) https://doi.org/10.1063/1.373544
- M. Klick, M. Kammeyer, W. Rehak, W. Kasper, P. Awakowicz and G. Franz, Surf. Coat. Technol. 98, 1395 (1998) https://doi.org/10.1016/S0257-8972(97)00261-2
- N. Mizutani and T. Hayashi, Thin Solid Films 374, 167 (2000) https://doi.org/10.1016/S0040-6090(00)01148-2
- T. Shirakawa and H. Sugai, Jpn. J. Appl. Phys. Part 1, 32, 5129 (1993)
- H. Kokura, K. Nakamura, I. P. Ghanashev and H. Sugai, Jpn. J. Appl. Phys. Part 1, 38, 5262 (1999)
- D. H. Looney and S. C. Brown, Phys. Rev. 93, 965 (1954) https://doi.org/10.1103/PhysRev.93.965
- T. Shirakawa and H. Sugai, Jpn. J. Appl. Phys. 32, 5129 (1993) https://doi.org/10.1143/JJAP.32.5129
- K. Nakamura, M. Ohata and H. Sugai, J. Vac. Sci. Technol. A 21, 325 (2003) https://doi.org/10.1116/1.1532740
- J. H. Kim, D. J. Seong, J. Y. Lim and K. H. Chung, Appl. Phys. Lett. 83, 4725 (2003) https://doi.org/10.1063/1.1632026
- J. H. Kim, S. C. Choi, Y. H. Shin and K. H. Chung, Rev. Sci. Inst. 75, 2706 (2004) https://doi.org/10.1063/1.1771487
- S. Y. So, A. Oda, H. Sugawara and Y. Sakai, J. Phys. D: Appl. Phys. 34, 1919 (2001) https://doi.org/10.1088/0022-3727/34/12/324
- H. Singh, J. W. Coburn and D. B. Graves, J. Vac. Sci. Technol. A 18, 2680 (2000) https://doi.org/10.1116/1.1308585
- S. Den, T. Kuno, M. Ito, M. Hori, T. Goto, Y. Hayashi and Y. Sakamoto, Jpn. J. Appl. Phys. 35, 6528 (1996) https://doi.org/10.1143/JJAP.35.6528
- J. H. Kim, Y. H. Shin, K. H. Chung and Y. S. Yoo, Appl. Phys. Lett. 85, 1922 (2004) https://doi.org/10.1063/1.1788880
- K. J. Taylor and G. R. Tynan, J. Vac. Sci. Technol. A 23, 634 (2005) https://doi.org/10.1116/1.1931680
- F. Gaboriau, M. C. Peignon, G. Cartry, L. Rolland, D. Eon, C. Cardinaud and G. Turban, J. Vac. Sci. Technol. A 20, 919 (2002) https://doi.org/10.1116/1.1474419
- M. V. Malyshev, V. M. Donnelly, S. W. Downey, J. I. Colonell and N. Layadi, J. Vac. Sci. Technol. A 18, 849 (2000) https://doi.org/10.1116/1.582266
- J. P. Booth, G. Hancock and N. D. Perry, Appl. Phys. Lett. 50, 318 (1987) https://doi.org/10.1063/1.98214