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Resistance Increase Behavior of HTS Wire with Stabilizer Layer on Applied Over-currents

  • Du, Ho-Ik (Department of Electrical Engineering, Chonbuk National University) ;
  • Kim, Min-Ju (Department of Electrical Engineering, Chonbuk National University) ;
  • Doo, Seung-Gyu (Department of Electrical Engineering, Chonbuk National University) ;
  • Kim, Yong-Jin (Department of Electrical Engineering, Chonbuk National University) ;
  • Han, Byoung-Sung (Department of Electrical Engineering, Chonbuk National University)
  • Published : 2009.04.25

Abstract

YBCO-coated conductors, called "second-generation wires," show a remarkably greater increase in the amount or speed of their resistance than BSCCO wires when a quench occurs. This is probably because of the specific resistance at their stabilizer layer, which also affects their voltage grade. YBCO coated conductors with copper as a stabilizer layer have a voltage grade of 1.5-2 V/cm, and those with stainless steel as a stabilizer layer have a voltage grade of about 0.5-0.6 V/cm. The voltage grade of YBCO coated conductors is important in selecting and applying superconducting wires to power instruments later. In this study, two kinds of YBCO-coated conductors with different stabilizer layers and one kind of BSCCO wire were prepared. Among them, based on the YBCO coated conductors that had a stainless steel stabilizer layer with a low voltage grade, five kinds of experimental samples for joining were prepared with the remaining two kinds of wires. Using the prepared samples, the current application properties and the resistance increase in the flux-flow and the quench states of the single wire and the joined wires were compared.

Keywords

References

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  2. Study on Transport Current Properties on YBCO Coated Conductor according to Aspect of Spiral Former Diameter vol.22, pp.12, 2009, https://doi.org/10.4313/JKEM.2009.22.12.1067
  3. Current Limiting Characteristics of Improved Flux-Lock Type SFCL According to Winding Direction of Coil 2 and Variable Number of Coil 1 and Coil 2 vol.23, pp.9, 2010, https://doi.org/10.4313/JKEM.2010.23.9.714