Analysis of Nano-contact Between Nano-asperities Using Atomic Force Microscopy

나노스케일 표면돌기 간의 미세접촉에 대한 해석

  • 안효석 (서울산업대학교 NID융합기술대학원 나노IT융합프로그램) ;
  • 장동영 (서울산업대학교 산업정보시스템공학과)
  • Published : 2009.08.15

Abstract

In micro/nano-scale contacts in MEMS and NEMS, capillary and van der Waals forces generated around contacting micro-asperities significantly influence the performance of concerning device as they are closely related to adhesion and stiction of interacting surfaces. In this regard, it is of prime importance to accurately estimate the magnitude of surface forces so that an optimal solution for reducing friction and adhesion of micro/nano-surfaces may be obtained We introduced an effective method to calculate these surface forces based on topography information obtained from an atomic force microscope. This method was used to calculate surface forces generated in the contact interface formed between diamond-like carbon coating and $Si_3N_4$ ball. This method is shown to effectively demonstrate the influence of capillary force in the contact area, especially in humid atmosphere.

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