Analyses of Fracture Parameters and Prediction of Crack Propagation Path on Delamination in the LSI Package

반도체 패키지의 층간박리 파괴역학인자 해석 및 균열진전경로 예측

  • Published : 2009.08.15

Abstract

This paper presents a method of calculating the stress intensity factor (K) and crack propagation direction (${\theta}_0$) at the crack-tip that is associated with delamination in the large scale integration(LSI) package. To establish a reasonable strength evaluation method and life prediction, it is necessary to assess fracture parameters under various fracture conditions. Therefore, we conducted quantitative stress singularity analysis considering thermal stress simulating the changes of crack length (a), (h) and (v) in delamination using the 2-dimensional elastic boundary element method (BEM), and from these results predicted crack propagation direction and path.

Keywords

References

  1. Chung, N. Y. and Park, C. H., 2005, "Analysis of Stress Singularities on Interfaces of Friction Welded Dissimilar Materials," Transaction of the KSAE, Vol. 13, No.2, pp. 142-148.
  2. Ju, Y, Saka, M., and Abe, R., 2001, "Detection of Delamination in IC Packages Using the Phase of Microwaves," International Journal of NDT & E, Vol. 34, pp. 49-56.
  3. Chung, N. Y and Song, C. H., 1996, "Prediction of Propagation Path for the Interface Crack in Bonded Dissimilar Materials," Transaction of the KSAE, Vol. 4, No.3, pp. 111-121.
  4. Miura, R., Nishimura, A., Kawai, S., and Nishi K., 1998, "Residual Stress in Resin-Molded IC Chips," Transaction of the JSME, Vol. 55, No. 516, pp. 1763-1770.
  5. Miura, R., Nishimura, A., Kawai, S., and Murakami, G., 1990, "Effect of Package Structures on the Residual Stress of Silicon Chips Encapsulated in IC Plastic Packages," Transaction of the JSME, Vol. 56, No. 522, pp. 175-181.
  6. Sato, M., Ruuki, R., Yoshoka, S., and Inoue, A., 1994, "Analysest of Delamination Arrest Effect of Dimples on Interface in LSI Package," Transaction of the JSME, Vol. 60, No. 577, pp. 1985-1991.
  7. Lee, K. Y, Moon, H. S., Lee, T. S., and Kim, K. S., 1995, "Plastic IC Package Cracking Analysis due to Thermal Stress," Transaction of the KSME, Vol. 19, No. 12, pp. 3197-3204.
  8. Lee, K. Y and Yang, J. H., 1998, "Viscoelastic Cracking Analysis of Plastic IC Package with Polyimide Coating Layer," Transaction of the KSME, Vol. 22, No. 10, pp. 1930-1937.
  9. Park, S. S., Pahn, L. O., and Earmme, Y. Y., 1994, "A Fracture Mechanics Approach on Delamination and Package Crack in Electronic Packaging(2)," Transaction of the KSME, Vol. 18, No.8, pp. 2158-2166.
  10. Alpen, P. and Lee, K. C., 2000, "A Simple Model for the Mode I Popcorn Effect for IC Packages," Microelectronics Reliability, Vol. 40, pp. 1503-1508.
  11. Chung, N. Y., 2008, "Prediction of Crack Propagation Path Using Boundary Element Method in IC Packages," Transaction of the KSAE, Vol. 16, No.3, pp. 15-22.