Applied Microscopy

Korean Society of Microscopy (한국현미경학회)
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Applications of Focused Ion Beam for Biomedical Research

의생물 연구 분야에서 집속이온빔장치의 응용

  • Kim, Ki-Woo (National Instrumentation Center for Environmental Management, Seoul National University) ;
  • Baek, Saeng-Geul (National Instrumentation Center for Environmental Management, Seoul National University) ;
  • Park, Byung-Joon (NTS Division, Carl Zeiss Co. Ltd.) ;
  • Kim, Hyun-Wook (Department of Anatomy, College of Medicine Korea University) ;
  • Rhyu, Im-Joo (Department of Anatomy, College of Medicine Korea University)
  • 김기우 (서울대학교 농생명과학공동기기원) ;
  • 백생글 (서울대학교 농생명과학공동기기원) ;
  • 박병준 (칼자이스 NTS사업부) ;
  • 김현욱 (고려대학교 의과대학 해부학교실) ;
  • 류임주 (고려대학교 의과대학 해부학교실)
  • Received : 2010.12.01
  • Accepted : 2010.12.15
  • Published : 2010.12.31
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Abstract

A focused ion beam (FIB) system produces a beam of positive ions (usually gallium) which are heavier than electrons and can be focused by electrostatic lenses into a spot on the specimen. With its ability milling of the specimen material by 10 to 100 nm with each pass of the beam, FIB is widely adopted in materials science, semiconductor industry, and ceramics research. Recently, FIB has been increasingly employed in the field of biomedical sciences. Here we provide a brief introduction to FIB and its applications for a wide variety of biomedical research. The surface of specimen can be in situ processed and quasi-real time visualized by two beam combination of FIB and field emission scanning electron microscope (FESEM). Due to its milling process, internal structures can be exposed and analyzed: yeast cells, fungus-inoculated wheat leaf, mannitol particles in inhalation aerosols, and oyster shell. Serial blockface tomography with the system kindles 3-dimensional reconstruction researches in the realm of nervous system and life sciences. Two-beam system of FIB/FESEM is a versatile tool to be utilized in the biomedical sciences, especially in 3-dimensional reconstruction studies.

집속이온빔장치(focused ion beam, FIB)는 전자보다 무거운 양이온빔을 이용하여 시료를 10~100 nm 정도로 깎아 낼 수 있는 장비로 주로 재료분야에서 활용되어 왔다. 최근 세계적으로 의생물 분야에서의 활용이 점차 늘어나고 있는 추세에 있어 국내연구자들의 이해를 돕기 위해 간단히 기기의 메커니즘과 그 활용예를 기술 하고자 한다. FIB에 주로 사용되는 갈륨(Ga)빔의 특성 때문에 시료의 표면을 효과적으로 쳐 낼 수 있고, 전계 방사형 주사전자현미경(FESEM)을 이용하면 그 표면의 영상을 얻을 수 있다. 이 두 가지 시스템을 하나의 시스템으로 묶어낸 것을 dual beam system이라고 한다. 최근 이러한 시스템을 이용하여 효모, 병원균에 감염된 식물 등이 소개되었으며, 통상적으로 경도가 높아 처리하기 힘든 상아나 어패류의 껍질 등의 시료를 효과적으로 분석한 연구도 있다. 또한 FIB를 이용한 밀링과 FESEM을 이용한 절단면 촬영을 반복하여 얻는 영상을 이용하여 신경계의 연결망을 재구성하려는 연구가 활발하게 진행되고 있다. FIB/FESEM dual beam은 의생물학 분야의 다양한 연구에 활용될 수 있는 유용한 도구며, 의생물 시료의 3차원 연구에 크게 기여할 수 있을 것으로 판단된다.

Keywords

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