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Moisture Diffusion Analysis for Bendable Electronic Module Under Autoclave Test Condition

유연성 전자모듈에 대한 오토클레이브 시험조건에서의 습기확산해석

  • Han, Chang-Woon (Components & Materials Physics Research Center, Korea Electronics Technology Institute) ;
  • Oh, Chul-Min (Components & Materials Physics Research Center, Korea Electronics Technology Institute) ;
  • Hong, Won-Sik (Components & Materials Physics Research Center, Korea Electronics Technology Institute)
  • 한창운 (전자부품연구원 부품소재물리연구센터) ;
  • 오철민 (전자부품연구원 부품소재물리연구센터) ;
  • 홍원식 (전자부품연구원 부품소재물리연구센터)
  • Received : 2011.12.02
  • Accepted : 2012.02.23
  • Published : 2012.05.01

Abstract

A bendable electronic module is developed for a mobile application by using a low-cost roll-to-roll manufacturing process. In the module, a thin silicon chip is embedded in a polymer-based encapsulating adhesive between flexible copper clad polyimide layers. A set of tests are conducted for the purpose of qualification: thermal shock, high temperature storage, and autoclave tests. During the autoclave test, delamination occurs at many places within the module layers. To investigate the failure mechanism, moisture diffusion analysis is conducted for the interior of the module under the autoclave test condition. For the analysis, the hygroscopic characteristics of the encapsulating materials are experimentally determined. Analysis results indicate the moisture saturation process in the interior of the module under the autoclave test condition.

이동용 전자기기에 적용 가능한 유연성 전자모듈이 롤투롤 공정에 의해 개발되었다. 개발된 전자 모듈은 최 외곽의 두 폴리이미드 층과 그 사이의 동선과 이방성도전필름과 박막 실리콘 칩과 모듈의 봉지재 역할을 하는 접착재료로 구성된다. 개발된 유연성 전자모듈의 신뢰성을 평가하기 위하여 열충격시험, 고온고습 시험, 오토클레이브 시험을 수행하였다. 시험수행 결과 두 시험에서는 문제가 발생하지 않았으나, 오토클레이브 시험에서는 대부분의 시편 모듈 내에 박리가 발생하였다. 발생한 박리의 고장 메커니즘을 연구하기 위하여 봉지재의 흡습 관련 물성치를 실험적으로 분석하고 오토클레이브 시험조건에서의 모듈 내 습기확산과정을 범용 유한요소 프로그램을 이용하여 분석하였다. 해석결과로부터 오토클레이브 시험조건에서 모듈 내에 발생하는 습기확산과정을 밝혀낼 수 있었다.

Keywords

References

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Cited by

  1. Failure Mechanism of Bendable Embedded Electronic Module Under Various Environment Conditions vol.31, pp.5, 2013, https://doi.org/10.5781/KWJS.2013.31.5.59
  2. Stress Analysis for Bendable Electronic Module Under Thermal-Hygroscopic Complex Loads vol.37, pp.5, 2013, https://doi.org/10.3795/KSME-A.2013.37.5.619