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A Study on Accelerated Life Test of Halogen Lamps for Medical Device

의료용 할로겐램프의 가속수명시험에 관한 연구

  • Jung, Jae Han (Department of Industrial and Management Engineering, Graduate School, Kyonggi University) ;
  • Kim, Myung Soo (Department of Industrial Engineering, Suwon University) ;
  • Lim, Heonsang (Samsung Electronics Co., Ltd.) ;
  • Kim, Yong Soo (Department of Industrial and Management Engineering, Kyonggi University)
  • 정재한 (경기대학교 대학원 산업경영공학과) ;
  • 김명수 (수원대학교 산업공학과) ;
  • 임헌상 (삼성전자(주)) ;
  • 김용수 (경기대학교 산업경영공학과)
  • Received : 2013.09.22
  • Accepted : 2013.11.25
  • Published : 2013.12.31

Abstract

Purpose: The purpose of this study was to estimate life time of halogen lamps and acceleration factors using accelerated life test. Methods: Voltage was selected as an accelerating variable through the technical review about failure mechanism. The test was performed at 14.5V, 15.5V and 16.5 for 4,471 hours. It was assumed that the lifetime of Halogen lamps follow Weibull distribution and the inverse power life-stress relationship models. Results: Mean lifetimes of pin and screw types were 19,477 hours and 6,056 hours, respectively. In addition, acceleration factor of two items are calculated as 4.8 and 2.2 based on 15.5V, respectively. Conclusion: The life-stress relationship, acceleration factor, and MTTF at design condition are estimated by analyzing the accelerated life test data. These results suggest that voltage was very important factor to accelerate life time in the case of halogen lamps and the life time of pin type is three times longer than screw type lamps.

Keywords

References

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