Journal of Applied Reliability (한국신뢰성학회지:신뢰성응용연구)

The Korean Reliability Society (한국신뢰성학회)
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Bayesian Reliability Estimation for Small Sample-Sized One-shot Devices

작은 샘플 크기의 One-shot Devices를 위한 베이지안 신뢰도 추정

  • Mun, Byeong Min (Department of Industrial Engineering, Hanyang University) ;
  • Sun, Eun Joo (Department of Industrial Engineering, Hanyang University) ;
  • Bae, Suk Joo (Department of Industrial Engineering, Hanyang University)
  • Received : 2013.05.09
  • Accepted : 2013.06.08
  • Published : 2013.06.25
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Abstract

One-shot device is required to successfully perform its function only once at the moment of use. The reliability of a one-shot device should be expressed as a probability of success. In this paper, we propose a bayesian approach for estimating reliability of one-shot devices with small sample size. We employ a gamma prior to obtain the posterior distribution. Finally, we compare the accuracy of the proposed method with general maximum likelihood method.

Keywords

References

  1. Berger, J. O.(1985), Statistical Decision Theory and Bayesian Analysis, Springer, New York.
  2. Fan, T., Balakrishnan, N. and Chang, C.(2009), The Bayesian Approach for Highly Reliable Electro-explosive Devices using One-shot Device Testing, Journal of Statistical Computation and Simulation, 79(9), 1143-1154. https://doi.org/10.1080/00949650802142592
  3. Guikema, S. D.(2005), A Comparison of Reliability Estimation Methods for Binary Systems, Reliability Engineering and System Safety, 87, 365-376. https://doi.org/10.1016/j.ress.2004.06.007
  4. Guikema, S. D. and Pate-Cornell, M. E.(2004), Bayesian Analysis of Launch Vehicle Success Rates, Journal of Spacecraft and Rockets, 41(1), 93-102. https://doi.org/10.2514/1.9268
  5. Hamada, M. S., Wilson, A. G., Reese, C. S. and Martz H. F.(2008), Bayesian Reliability, Springer Verlag.
  6. Zhao, M. and Xie, M.(1994), A Model of Storage Reliability with Possible Initial Failures, Reliability Engineering and System Safety, 43, 269-273. https://doi.org/10.1016/0951-8320(94)90031-0
  7. Zhao, M., Xie, M. and Zhang, Y. T.(1995), A Study of a Storage Reliability Estimation Problem, Quality and Reliability Engineering International, 11, 123-127. https://doi.org/10.1002/qre.4680110208