JSTS:Journal of Semiconductor Technology and Science

The Institute of Electronics and Information Engineers (대한전자공학회)
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Current-Integrating DFE with Sub-UI ISI Cancellation for Multi-Drop Channels

  • Park, Hwan-Wook (College of Information and Communication Engineering, Sungkyunkwan University) ;
  • Lim, Hyun-Wook (College of Information and Communication Engineering, Sungkyunkwan University, Samsung Electronics) ;
  • Kong, Bai-Sun (College of Information and Communication Engineering, Sungkyunkwan University)
  • Received : 2015.09.03
  • Accepted : 2015.12.09
  • Published : 2016.02.28
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Abstract

This paper presents a half-rate current-integrating DFE receiver with sub-unit interval (sub-UI) inter-symbol interference (ISI) cancellation. By having a single additional DFE tap in each data path, the proposed DFE receiver can minimize BER degradation due to input pattern dependency and feedback tap latency problems in conventional current-integrating DFE receivers. The proposed DFE receiver was designed and fabricated in a 45 nm CMOS process, whose measurement results indicated that the BER bathtub width is increased from 0.235 UI to 0.315 UI (34% improvement) at $10^{-12}$ BER level.

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References

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