References
- N. Setter, D. Damjanovic, L. Eng, G. Fox, S. Gevorgian, S. Hong, A. Kingon, H. Kohlstedt, N. Y. Park, G. B. Stephenson, I. Stolitchnov, A. K. Taganstev, D. V. Taylor, T. Yamada, and S. Streiffer, J. Appl. Phys., 100, 051606 (2006). [DOI: http://dx.doi.org/10.1063/1.2336999]
- H. Ishiwara, J. Nanosci. Nanotechnol., 12, 7619 (2012). [DOI: http://dx.doi.org/10.1166/jnn.2012.6651]
- M. Dawber and J. F. Scott, Appl. Phys. Lett., 76, 1060 (2000). [DOI: http://dx.doi.org/10.1063/1.125938]
- G. Asano, H. Morioka, H. Funakubo, T. Shibutami, and N. Oshima, Appl. Phys. Lett., 83, 5506 (2003). [DOI: http://dx.doi.org/10.1063/1.1635964]
- J. H. Kim, K. S. Koh, and W. K. Choo, J. Kor. Phys. Soc., 42, 1313 (2003). [DOI: http://dx.doi.org/10.3938/jkps. 42.1313]
- C. Guerrero, J. Roldan, C. Ferrater, M. V. Garcia-Cuenca, F. Sanchez, and M. Varela, Solid-State Electron., 45, 1433 (2001). [DOI:http://dx.doi.org/10.1016/S0038-1101(00)0275 -6]
- Q. Zhang and R. W. Whatmore, J. Appl. Phys., 94, 5228 (2003). [DOI: http://dx.doi.org/10.1063/1.1613370]
- C. A. Araujo, J. D. Cuhairo, L. D. McMillan, M. C. Scott, and J. F. Scott, Nature, 374, 627 (1994). [DOI: http://dx.doi.org/10.1038/374627a0]
- P. C. Joshi and S. B. Krupanidhi, Appl. Phys. Lett., 62, 1928 (1993). [DOI: http://dx.doi.org/10.1063/1.109547]
- K. Ishikawa, K. Yoshikawa, and K. Okada, Phys. Rev. B, 37, 5852 (1988). [DOI: http://dx.doi.org/10.1103/PhysRevB.37.5852]
- C. B. Eom, R. J. Cava, R. M. Fleming, J. M. Phillips, R. B. van Dover, J. H. Marshall, J.W.P. Hsu, J. J. Krajewski, and W. F. Peck, Jr., Science, 258, 1766 (1992). [DOI: http://dx.doi.org/10.1126/science.258.5089.1766]
- C. W. Jones, P. D. Battle, P. Lightfoot, and W.T.A. Harrison, Acta. Cryst., C45, 365 (1989). [DOI: http://dx.doi.org/10.1107/S0108270188012077]
- J. F. Scott, L. Kammerdiner, M. Parris, S. Traynor, V. Ottenbacher, A. Shawabkeh, and W. F. Oliver, J. Appl. Phys., 64, 787 (1988). [DOI: http://dx.doi.org/10.1063/1. 341925]
- H. F. Kay and J. W. Dunn, Philos. Mag., 7, 2027 (1962). [DOI: http://dx.doi.org/10.1080/14786436208214471]