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Extraction of a Distance Parameter in Optical Scanning Holography Using Axis Transformation

  • Kim, Tae-Geun (Department of Optical Engineering, Sejong University) ;
  • Kim, You-Seok (Department of Optical Engineering, Sejong University)
  • Received : 2010.03.23
  • Accepted : 2010.04.13
  • Published : 2010.06.25

Abstract

We proposed an axis transformation technique which reveals a distance parameter directly from optical scanning holography (OSH). After synthesis of a real-only spectrum hologram and power fringe adjusted filtering, we transform an original frequency axis to a new frequency axis using interpolation. In the new frequency axis, the filtered hologram has a single frequency which is linearly proportional to the distance parameter. Thus, the inverse Fourier transformation of the filtered hologram gives a delta function pair in the new spatial axis. Finally, we extract the distance parameter by detecting the location of the delta function pair.

Keywords

References

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