Journal of the Microelectronics and Packaging Society (마이크로전자및패키징학회지)

The Korean Microelectronics and Packaging Society (한국마이크로전자및패키징학회)
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Reliability of Metal Electrode for Flexible Electronics

유연성 소자용 금속 전극의 신뢰성 연구 동향

  • Kim, Byoung-Joon (Institute for Applied Materials (IAM-WBM), Karlsruhe Institute of Technology)
  • Received : 2013.12.17
  • Accepted : 2013.12.26
  • Published : 2013.12.30
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Abstract

Recently, various types of flexible devices such as flexible displays, batteries, e-skins and solar cell panels have been reported. Most of the researches focus on the development of high performance flexible device. However, to realize these flexible devices, the long-term reliability should be guaranteed during the repeated deformations of flexible devices because the direct mechanical stress would be applied on the electronic devices unlike the rigid Si-based devices. Among various materials consisting electronics devices, metal electrode is one of the weakest parts against mechanical deformation because the mechanical and electrical properties of metal films degrade gradually due to fatigue damage during repeated deformations. This article reviews the researches of fatigue behavior of thin metal film, and introduces the methods to enhance the reliability of metal electrode for flexible device.

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References

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