Design of Automatic Defect Classification System for Wafer Edge Defect Inspection
| No | 이름 | 이메일 | 기관 |
|---|---|---|---|
| 1 | Chan Ju Jeong | - | Department of Electronics Engineering, Myongji University |
| 2 | Min Su Han | - | Department of Electronics Engineering, Myongji University |
| 3 | Jeong Woo Kim | - | Department of Electronics Engineering, Myongji University |
| 4 | Hyun Ho Hong | - | Department of Electronics Engineering, Myongji University |
| 5 | Hyung Jin Lim | - | Department of Electronics Engineering, Myongji University |
| 6 | Daewon Lee | - | Department of Electronics Engineering, Myongji University |
| 7 | Sang Jeen Hong | - | Semiconductor Equipment Engineering Program, Myongji University |
| 8 | Garam Kim | - | Department of Electronics Engineering, Myongji University |