5 MeV 및 25 MeV 양성자 조사에서 TMAH 공정을 적용한 GaN MIS-HEMT의 전기적 특성 변화
| No | 이름 | 이메일 | 기관 |
|---|---|---|---|
| 1 | Kyeong Min Kim | - | Department of Electronic Engineering, Andong National University |
| 2 | Kyung Hee Kim | - | Department of Electronic Engineering, Andong National University |
| 3 | Yeong Hwan Kim | - | Department of Electronic Engineering, Andong National University |
| 4 | Jong Beom Im | - | Department of Electronic Engineering, Andong National University |
| 5 | Gyu Ho Choi | - | Department of Electronic Engineering, Andong National University |
| 6 | Young Jun Yoon | - | Department of Electronic Engineering, Andong National University |